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Resultados para Tema: Ciencia, Ingenieria (1 a 10 de más de 200)
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Título | 129 Advances On Models, Characterizations And Applications | Precio | $1150.42 |
| Autor | Balakrishnan, N. -Bairamov, I. H. And Gebizlioglu, O. L. | Año | ||
| Editorial | Chapman & Hall / Crc | Edición | 2005 | |
| Tema | Matematicas, Ingenieria, Ciencia | ISBN | 464654654654565 |
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Título | A Guide To Monte Carlo Simulations In Statistical Physics | Precio | $935.00 |
| Autor | Landau / Binder | Año | 2005 | |
| Editorial | Cambridge University Press | Edición | 1ª | |
| Tema | Ciencia, Fisica, Ingenieria | ISBN | 9780521842389 |
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Título | A Numerical Library In Java For Scientists And Engineers | Precio | $1540.00 |
| Autor | Lau, Hang T. | Año | 2003 | |
| Editorial | Chapman & Hall / Crc | Edición | 1ª | |
| Tema | Biblioteconomia, Ciencia, Ingenieria | ISBN | 9781584884309 |
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Título | Adaptive Low-Power Circuits For Wireless Communications | Precio | $1428.00 |
| Autor | Tasic / Serdijn / Long | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Comunicacion | ISBN | 9781402052491 |
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Título | Advanced Digital Logic: State Machine Design Using Vhdl, Verilog, And Synthesis | Precio | $474.00 |
| Autor | Lee, Sunggu | Año | 2004 | |
| Editorial | International Thomson Editores | Edición | 1ª | |
| Tema | Computacion, Ingenieria, Ciencia | ISBN | 9780534466022 |
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Título | Advances In Information Technologies For Electromagnetics | Precio | $2388.00 |
| Autor | Tarricone / Esposito | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Tecnologia, Ciencia | ISBN | 9781402047480 |
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Título | Adventures With a Microscope | Precio | $241.00 |
| Autor | Headstrom, Richard | Año | 1977 | |
| Editorial | Dover Publications, Inc. | Edición | 1ª | |
| Tema | Ciencia, Tecnologia, Ingenieria | ISBN | 9780486234717 |
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Título | Adversarial Reasoning. Computational Approaches To Reading The Opponents Mind | Precio | $1420.00 |
| Autor | Kott Alexander/ Mceneaney William M | Año | 2006 | |
| Editorial | Chapman & Hall / Crc | Edición | 1ª | |
| Tema | Computacion, Ciencia, Ingenieria | ISBN | 9781584885887 |
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Título | Algebra Lineal y Sus Aplicaciones. | Precio | $408.00 |
| Autor | Del Valle. | Año | 2012 | |
| Editorial | Mc Graw Hill Interamericana de Mexico | Edición | 1ª | |
| Tema | Ingenieria, Ciencia | ISBN | 9789701068854 |
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Título | Aluminium Design And Construction | Precio | $2442.00 |
| Autor | Dwight, John | Año | 1999 | |
| Editorial | E & Fn Spon | Edición | 1ª | |
| Tema | Ciencia, Ingenieria, Fisica | ISBN | 9780419157106 |
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Autores
Albiol / GironaAmbardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Baliga JayantBarabasi / StanleyBasmadjian / FarnoodBatty, MichaelBebendorf MarioBechtold / Rudnyi / KorvinkBellomo, NicolaBen-Naim, AriehBenedetto, John J.Bermejo, SergiBertoline/ Wiebe.Billingsley / Bradbeer (Ed.)Billo, J.Boccara, NinoBodie / Kane / MarcusBottcher AlbrechtBourg, DavidBoylestad, -NashelskyBrannan James/ Boyce William.Bryant, John; Sangwin, ChrisButz, TilmanCallegaro LucaCantor, BrianCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapman Stephen J.Chapman, StephenChapra Steven C.Chapra, StevenChen, Goong; Zhou, Jianxin (Ed)Cheng, David K.ChiarellaChimal, CarlosChu Paul/ Liu XuanyongCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavis, JosephDe Lisi, StevenDel Valle.Dempsey Paul.Dimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Durand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEssick JohnEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldForouzan, BehrouzGass SaulGatesGent, Alan (Ed)Giancoli , Douglas C.Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGordon Wilson DavidGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Harris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeng Yeoh Guan/ Tu JiyuanHibbelerInstitution Of Mechanical
EngineersIsermann, RolfJanssen / Zuidema / WanhillJohnston / BushKahn PeterKantz / SchreiberKaplan, IlyaKatoh ShigeoKehlhofer / WarnerKennedy MichaelKing Paul H/ Fries Richard CKingslake Rudolf/ Johnson Barry RKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKreyszig, ErwinKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLara-Barragan / NuñezLau, Hang T.Law, ChungLee / Speiht / LoyalkaLee David W.Lee, SungguLindsay, JamesLogan Bruce E.Loney NormanMadou MarcMiracle Daniel/ Donaldson Steven.Mitin Vladimir/ Kochelap
Viatcheslav/ Stroscio MichaelMolera Sola, PereMoltgenMontaigne FenMontgomery Douglas C.Moore, HollyMorin DavidMorrison, JohnMorse / BabcpckMuller; Brisebarre; de Dinechin;
Jeannerod; Lefevre; MelquioMur / ManeroMurphy, ReginaMyler, HarleyNesbitt, BrianNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubOhanian , Hans C. ; Market, John
T.Olive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPandey AshokPaul, ClaytonPellon Jose R.Perez, CesarPlanchard David/ Planchard Marie.Rees, HerbertRivera Figueroa, Antonio.Ross Sheldon M.Sackinger, EducardSalerno, SaverioSanchez Vergara / Campos SilvaSchweitzer, PhilipScott K.Semiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShackelford James F.Shan Yin/ Yang AngShaw, MiltonShipley / BeckerSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Standiford, KevinSugumaran VijayanTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTompkins / WhiteTorge WolfgangToriwaki Junichiro/ Yoshida
HiroyukiTormos / LovaWang Zhenyuan/ Klir GeorgeWebb F. C.Yang, KaiYang, WeiYe, Zuo GuangYing X, Dong Xu And Jie LiangYoung y FreedmanZhang / Van Driel / Fan
Leevers P, And Rawlings R. . DArango / SanchezAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Baliga JayantBarabasi / StanleyBasmadjian / FarnoodBatty, MichaelBebendorf MarioBechtold / Rudnyi / KorvinkBellomo, NicolaBen-Naim, AriehBenedetto, John J.Bermejo, SergiBertoline/ Wiebe.Billingsley / Bradbeer (Ed.)Billo, J.Boccara, NinoBodie / Kane / MarcusBottcher AlbrechtBourg, DavidBoylestad, -NashelskyBrannan James/ Boyce William.Bryant, John; Sangwin, ChrisButz, TilmanCallegaro LucaCantor, BrianCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapman Stephen J.Chapman, StephenChapra Steven C.Chapra, StevenChen, Goong; Zhou, Jianxin (Ed)Cheng, David K.ChiarellaChimal, CarlosChu Paul/ Liu XuanyongCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavis, JosephDe Lisi, StevenDel Valle.Dempsey Paul.Dimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Durand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEssick JohnEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldForouzan, BehrouzGass SaulGatesGent, Alan (Ed)Giancoli , Douglas C.Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGordon Wilson DavidGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Harris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeng Yeoh Guan/ Tu JiyuanHibbelerInstitution Of Mechanical
EngineersIsermann, RolfJanssen / Zuidema / WanhillJohnston / BushKahn PeterKantz / SchreiberKaplan, IlyaKatoh ShigeoKehlhofer / WarnerKennedy MichaelKing Paul H/ Fries Richard CKingslake Rudolf/ Johnson Barry RKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKreyszig, ErwinKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLara-Barragan / NuñezLau, Hang T.Law, ChungLee / Speiht / LoyalkaLee David W.Lee, SungguLindsay, JamesLogan Bruce E.Loney NormanMadou MarcMiracle Daniel/ Donaldson Steven.Mitin Vladimir/ Kochelap
Viatcheslav/ Stroscio MichaelMolera Sola, PereMoltgenMontaigne FenMontgomery Douglas C.Moore, HollyMorin DavidMorrison, JohnMorse / BabcpckMuller; Brisebarre; de Dinechin;
Jeannerod; Lefevre; MelquioMur / ManeroMurphy, ReginaMyler, HarleyNesbitt, BrianNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubOhanian , Hans C. ; Market, John
T.Olive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPandey AshokPaul, ClaytonPellon Jose R.Perez, CesarPlanchard David/ Planchard Marie.Rees, HerbertRivera Figueroa, Antonio.Ross Sheldon M.Sackinger, EducardSalerno, SaverioSanchez Vergara / Campos SilvaSchweitzer, PhilipScott K.Semiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShackelford James F.Shan Yin/ Yang AngShaw, MiltonShipley / BeckerSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Standiford, KevinSugumaran VijayanTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTompkins / WhiteTorge WolfgangToriwaki Junichiro/ Yoshida
HiroyukiTormos / LovaWang Zhenyuan/ Klir GeorgeWebb F. C.Yang, KaiYang, WeiYe, Zuo GuangYing X, Dong Xu And Jie LiangYoung y FreedmanZhang / Van Driel / Fan
Editoriales
Academic PressAcribia EditorialAlfaomega Grupo Editor S.A. de
C.V.Anaya MultimediaAsm International - The Materials
Information SociBirkhauserButterworth-HeinemannCambridge University PressCesolChandos PublishingChapman & Hall / CrcConacultaCrc / Taylor & FrancisCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsIgi PublishingInternational Thomson EditoresIos PressJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill EducacionMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Nelson ThornesOxford University PressPearsonPearson Educacion de Mexico S.A.
de C.V.Pearson/Prentice HallPennwellPlenum Publishing CorporationPrincetonRa-MaRoberts & Company PublishersSchroff Development CorporationSintesis, Editorial S. A.Springer Publishing CompanySpringer Science+business Media
Inc.Taylor & FrancisThe Mit PressUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWalter Foster PublishingWileyWorld Scientific Publishing Co.
Inc
C.V.Anaya MultimediaAsm International - The Materials
Information SociBirkhauserButterworth-HeinemannCambridge University PressCesolChandos PublishingChapman & Hall / CrcConacultaCrc / Taylor & FrancisCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsIgi PublishingInternational Thomson EditoresIos PressJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill EducacionMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Nelson ThornesOxford University PressPearsonPearson Educacion de Mexico S.A.
de C.V.Pearson/Prentice HallPennwellPlenum Publishing CorporationPrincetonRa-MaRoberts & Company PublishersSchroff Development CorporationSintesis, Editorial S. A.Springer Publishing CompanySpringer Science+business Media
Inc.Taylor & FrancisThe Mit PressUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWalter Foster PublishingWileyWorld Scientific Publishing Co.
Inc
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Última actualización: Jul 2019