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Resultados para Tema: Ciencia, Ingenieria (131 a 140 de más de 200)
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Título | Probabilidad y Estadistica Para Ingenieria y Ciencias | Precio | $295.00 |
| Autor | Devore, Jay | Año | 2005 | |
| Editorial | International Thomson Editores | Edición | 6ª | |
| Tema | Probabilidad y Estadistica, Ingenieria, Ciencia | ISBN | 9706864571 |
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Título | Introduction To Rf Propagation | Precio | $2232.00 |
| Autor | Seybold, John | Año | 2005 | |
| Editorial | John Wiley & Sons Inc. | Edición | 1ª | |
| Tema | Ciencia, Tecnologia, Ingenieria | ISBN | 9780471655961 |
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Título | Fundamentals Of Jet Propulsion With Applications | Precio | $1287.00 |
| Autor | Flack, Ronald | Año | 2005 | |
| Editorial | Cambridge University Press | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Mecanica | ISBN | 9780521819831 |
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Título | Mechatronic Systems: Fundamentals | Precio | $879.45 |
| Autor | Isermann, Rolf | Año | 2005 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Mecatronica, Ingenieria, Ciencia | ISBN | 9781852339302 |
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Título | Sensor Networks And Configuration: Fundamentals, Standards, Platforms, And Appli | Precio | $1419.00 |
| Autor | Mahalik, Nitaigour (Ed.) | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Sistemas, Ciencia | ISBN | 9783540373643 |
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Título | Visual Perception And Robotic Manipulation: 3d Object Recognition, Tracking And | Precio | $1089.00 |
| Autor | Taylor / Kleeman | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Robotica | ISBN | 9783540334545 |
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Título | Fast Simulation Of Electro-Thermal Mems: Efficient Dynamic Compact Models | Precio | $1548.00 |
| Autor | Bechtold / Rudnyi / Korvink | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Tecnologia | ISBN | 9783540346128 |
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Título | Combustion Physics | Precio | $1045.00 |
| Autor | Law, Chung | Año | 2006 | |
| Editorial | Cambridge University Press | Edición | 1ª | |
| Tema | Ciencia, Fisica, Ingenieria | ISBN | 9780521870528 |
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Título | Adaptive Low-Power Circuits For Wireless Communications | Precio | $1428.00 |
| Autor | Tasic / Serdijn / Long | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Comunicacion | ISBN | 9781402052491 |
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Título | Redes Opticas | Precio | $862.00 |
| Autor | Campmany / Ortega | Año | 2006 | |
| Editorial | Universidad Politecnica de Valencia | Edición | 1ª | |
| Tema | Tecnologia, Ciencia, Ingenieria | ISBN | 9788483630013 |
Filtrar resultados
Autores
Albiol / GironaAlfonseca Cubero, Enrique( Et.
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezArbones Malisani, EduardoAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerAyyub Bilal M/ Klir George JBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Bara Temes, JavierBarabasi / StanleyBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBechtold / Rudnyi / KorvinkBeichelt FrankBell, W. WBellomo, NicolaBen-Naim, AriehBenedetto, John J.Berk, RonaladBermejo, SergiBertoline / WiebeBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Boccara, NinoBottcher AlbrechtBoylestad, -NashelskyBryce, Douglas M.Butz, TilmanCampmany / OrtegaCarter/ GregorichCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapra, StevenCheng, David K.ChiarellaChimal, CarlosCho HyungsuckCohen, LouComaniciu / MandayamConrad / MillsCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavenport Thomas H.Davis, JosephDe Lisi, StevenDempsey Paul.Devore, JayDimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldFridman Alexander/ Kennedy
Lawrence AGass SaulGatesGent, Alan (Ed)Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Hansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeld GilbertHibbelerInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJohnston / BushJordan, Thomas F.Kahn PeterKantz / SchreiberKaplan, IlyaKehlhofer / WarnerKern , Donald Q.KhanKiusalaas, JaanKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKrishnamoorti / VaiaKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLau, Hang T.Law, ChungLee KunwooLee, SungguLindsay, JamesMadou MarcMahalik, Nitaigour (Ed.)Masot Peris, Rafael (Et. Al)Mccabe / Smith / HarriottMiracle Daniel/ Donaldson Steven.Molera Sola, PereMoltgenMontaigne FenMontufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorse / BabcpckMur / ManeroMurphy, ReginaMyler, HarleyNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOlive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPaul, ClaytonPellon Jose R.Perez, CesarPetroski, Henry.Planchard David & Marie.Potter / SomertonRastogiRees, HerbertRosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSanchez Vergara / Campos SilvaSchaffer, Saxsena, Antolovich,
Sanders, WarnerSchweitzer, PhilipSemiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShankar P NShapiro HowardShaw, MiltonSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Sripimanwat, Keattisak (Ed.)Standiford, KevinTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTennant, GeoffTerrella Alcaraz, EnriqueTompkins / WhiteTormos / LovaTurns StephenTurns, StephenWebb F. C.Wunsch , A. DavidYang, KaiYang, WeiZhang / Van Driel / Fan
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezArbones Malisani, EduardoAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerAyyub Bilal M/ Klir George JBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Bara Temes, JavierBarabasi / StanleyBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBechtold / Rudnyi / KorvinkBeichelt FrankBell, W. WBellomo, NicolaBen-Naim, AriehBenedetto, John J.Berk, RonaladBermejo, SergiBertoline / WiebeBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Boccara, NinoBottcher AlbrechtBoylestad, -NashelskyBryce, Douglas M.Butz, TilmanCampmany / OrtegaCarter/ GregorichCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapra, StevenCheng, David K.ChiarellaChimal, CarlosCho HyungsuckCohen, LouComaniciu / MandayamConrad / MillsCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavenport Thomas H.Davis, JosephDe Lisi, StevenDempsey Paul.Devore, JayDimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldFridman Alexander/ Kennedy
Lawrence AGass SaulGatesGent, Alan (Ed)Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Hansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeld GilbertHibbelerInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJohnston / BushJordan, Thomas F.Kahn PeterKantz / SchreiberKaplan, IlyaKehlhofer / WarnerKern , Donald Q.KhanKiusalaas, JaanKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKrishnamoorti / VaiaKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLau, Hang T.Law, ChungLee KunwooLee, SungguLindsay, JamesMadou MarcMahalik, Nitaigour (Ed.)Masot Peris, Rafael (Et. Al)Mccabe / Smith / HarriottMiracle Daniel/ Donaldson Steven.Molera Sola, PereMoltgenMontaigne FenMontufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorse / BabcpckMur / ManeroMurphy, ReginaMyler, HarleyNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOlive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPaul, ClaytonPellon Jose R.Perez, CesarPetroski, Henry.Planchard David & Marie.Potter / SomertonRastogiRees, HerbertRosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSanchez Vergara / Campos SilvaSchaffer, Saxsena, Antolovich,
Sanders, WarnerSchweitzer, PhilipSemiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShankar P NShapiro HowardShaw, MiltonSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Sripimanwat, Keattisak (Ed.)Standiford, KevinTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTennant, GeoffTerrella Alcaraz, EnriqueTompkins / WhiteTormos / LovaTurns StephenTurns, StephenWebb F. C.Wunsch , A. DavidYang, KaiYang, WeiZhang / Van Driel / Fan
Editoriales
Academic PressAcribia EditorialAddison Wesley Longman de Mexico
S. A.Alfaomega Grupo Editor S.A. de
C.V.Alpha BooksAmerican Chemical SocietyAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcConacultaCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGowerGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsHarvard Business SchoolIeee Computer SocietyIgi PublishingImperial College PressInternational Thomson EditoresJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearson Benjamin CummingsPearson Educacion de Mexico S.A.
de C.V.Pearson/Addison WesleyPearson/Prentice HallPennwellPlenum Publishing CorporationPrinceton University PressRa-MaRoberts & Company PublishersSintesis, Editorial S. A.Society Of Manufacturing EngineersSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWorld Scientific Publishing Co.
Inc
S. A.Alfaomega Grupo Editor S.A. de
C.V.Alpha BooksAmerican Chemical SocietyAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcConacultaCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGowerGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsHarvard Business SchoolIeee Computer SocietyIgi PublishingImperial College PressInternational Thomson EditoresJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearson Benjamin CummingsPearson Educacion de Mexico S.A.
de C.V.Pearson/Addison WesleyPearson/Prentice HallPennwellPlenum Publishing CorporationPrinceton University PressRa-MaRoberts & Company PublishersSintesis, Editorial S. A.Society Of Manufacturing EngineersSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWorld Scientific Publishing Co.
Inc
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