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Resultados para Tema: Ciencia, Ingenieria (151 a 160 de más de 200)
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Título | Stochastic Processes In Science, Engineering And Finance | Precio | $1350.00 |
| Autor | Beichelt Frank | Año | 2006 | |
| Editorial | Chapman & Hall / Crc | Edición | 1ª | |
| Tema | Matematicas, Ingenieria, Ciencia | ISBN | 9781584884934 |
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Título | Combined-Cycle Gas And Steam Turbine Power Plants | Precio | $1500.00 |
| Autor | Kehlhofer / Warner | Año | 2006 | |
| Editorial | Pennwell | Edición | 1ª | |
| Tema | Ciencia, Ingenieria | ISBN | 9780878147366 |
|
Título | Hazardous Materials Incidents; Surviving The Initial Response | Precio | $750.00 |
| Autor | De Lisi, Steven | Año | 2006 | |
| Editorial | Pennwell | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Quimica | ISBN | 9781593700713 |
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Título | Engineering Drawing And Design | Precio | $518.00 |
| Autor | Standiford, Kevin | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 4ª | |
| Tema | Ingenieria, Ciencia, Tecnologia | ISBN | 9781418029883 |
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Título | Digital Signal Processing - a Modern Introduction | Precio | $468.00 |
| Autor | Ambardar, Ashok | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Computacion | ISBN | 9780534405090 |
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Título | Ccna Self-Study Guide Exam #640-801 | Precio | $119.00 |
| Autor | Chiarella | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 2ª | |
| Tema | Electronica, Ciencia, Ingenieria | ISBN | 9781418005740 |
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Título | Rfid+: The Complete Review Of Radio Frequency Identification Today's Technician: | Precio | $385.00 |
| Autor | Cooney, Elaine | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 1ª | |
| Tema | Electronica, Ciencia, Ingenieria | ISBN | 9781418052317 |
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Título | Combustion Physics | Precio | $1045.00 |
| Autor | Law, Chung | Año | 2006 | |
| Editorial | Cambridge University Press | Edición | 1ª | |
| Tema | Ciencia, Fisica, Ingenieria | ISBN | 9780521870528 |
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Título | Introduction To Electromagnetic Compatibility (Wiley Series In Microwave And Opt | Precio | $1560.00 |
| Autor | Paul, Clayton | Año | 2006 | |
| Editorial | John Wiley & Sons Inc. | Edición | 2ª | |
| Tema | Ingenieria, Electronica, Ciencia | ISBN | 9780471755005 |
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Título | Solar Engineering Of Thermal Processes | Precio | $1958.00 |
| Autor | Duffie John/ Beckman William | Año | 2006 | |
| Editorial | John Wiley & Sons Inc. | Edición | 3ª | |
| Tema | Ingenieria, Energia, Ciencia | ISBN | 9780471698678 |
Filtrar resultados
Autores
Albiol / GironaAlfonseca Cubero, Enrique( Et.
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezArbones Malisani, EduardoAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerAyyub Bilal M/ Klir George JBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Bara Temes, JavierBarabasi / StanleyBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBechtold / Rudnyi / KorvinkBeichelt FrankBell, W. WBellomo, NicolaBen-Naim, AriehBenedetto, John J.Berk, RonaladBermejo, SergiBertoline / WiebeBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Boccara, NinoBottcher AlbrechtBoylestad, -NashelskyBryce, Douglas M.Butz, TilmanCampmany / OrtegaCarter/ GregorichCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapra, StevenCheng, David K.ChiarellaChimal, CarlosCho HyungsuckCohen, LouComaniciu / MandayamConrad / MillsCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavenport Thomas H.Davis, JosephDe Lisi, StevenDempsey Paul.Devore, JayDimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldFridman Alexander/ Kennedy
Lawrence AGass SaulGatesGent, Alan (Ed)Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Hansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeld GilbertHibbelerInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJohnston / BushJordan, Thomas F.Kahn PeterKantz / SchreiberKaplan, IlyaKehlhofer / WarnerKern , Donald Q.KhanKiusalaas, JaanKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKrishnamoorti / VaiaKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLau, Hang T.Law, ChungLee KunwooLee, SungguLindsay, JamesMadou MarcMahalik, Nitaigour (Ed.)Masot Peris, Rafael (Et. Al)Mccabe / Smith / HarriottMiracle Daniel/ Donaldson Steven.Molera Sola, PereMoltgenMontaigne FenMontufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorse / BabcpckMur / ManeroMurphy, ReginaMyler, HarleyNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOlive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPaul, ClaytonPellon Jose R.Perez, CesarPetroski, Henry.Planchard David & Marie.Potter / SomertonRastogiRees, HerbertRosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSanchez Vergara / Campos SilvaSchaffer, Saxsena, Antolovich,
Sanders, WarnerSchweitzer, PhilipSemiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShankar P NShapiro HowardShaw, MiltonSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Sripimanwat, Keattisak (Ed.)Standiford, KevinTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTennant, GeoffTerrella Alcaraz, EnriqueTompkins / WhiteTormos / LovaTurns StephenTurns, StephenWebb F. C.Wunsch , A. DavidYang, KaiYang, WeiZhang / Van Driel / Fan
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezArbones Malisani, EduardoAskeland, D. R.Askin / StandridgeAsm InternationalAsm International / StefanescuAsm International / SteinerAvedesian / BakerAyyub Bilal M/ Klir George JBachs / Cuesta / CarlesBaez Lopez DavidBalakrishnan, N. -Bairamov, I. H.
And Gebizlioglu, O. L.Bara Temes, JavierBarabasi / StanleyBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBechtold / Rudnyi / KorvinkBeichelt FrankBell, W. WBellomo, NicolaBen-Naim, AriehBenedetto, John J.Berk, RonaladBermejo, SergiBertoline / WiebeBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Boccara, NinoBottcher AlbrechtBoylestad, -NashelskyBryce, Douglas M.Butz, TilmanCampmany / OrtegaCarter/ GregorichCelleti / Ferraz-Mello / HenrardCengelCengel, YunusChao AlexChapra, StevenCheng, David K.ChiarellaChimal, CarlosCho HyungsuckCohen, LouComaniciu / MandayamConrad / MillsCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDavenport Thomas H.Davis, JosephDe Lisi, StevenDempsey Paul.Devore, JayDimatteo / LampmanDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineDwight, JohnEnderle / Blanchard / BronzinoEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFerre Masip, RafaelFischer-CrippsFlack, RonaldFridman Alexander/ Kennedy
Lawrence AGass SaulGatesGent, Alan (Ed)Gieck, Kurt; Gieck, ReinerGilmore, RobertGimenez / Riera / VidaurreGodfrey OnwuboluGoertzel BenGonzalez Velasco Juan RGoodman, JosephGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHaile, J. M.Hamming R. W.Hansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Headstrom, RichardHeld GilbertHibbelerInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJohnston / BushJordan, Thomas F.Kahn PeterKantz / SchreiberKaplan, IlyaKehlhofer / WarnerKern , Donald Q.KhanKiusalaas, JaanKleinstreuer, ClementKnezevic / MilaniKorn / KornKott Alexander/ Mceneaney William
MKrishnamoorti / VaiaKuo / GolnaraghiKutz, MyerLandau / BinderLandolt DieterLau, Hang T.Law, ChungLee KunwooLee, SungguLindsay, JamesMadou MarcMahalik, Nitaigour (Ed.)Masot Peris, Rafael (Et. Al)Mccabe / Smith / HarriottMiracle Daniel/ Donaldson Steven.Molera Sola, PereMoltgenMontaigne FenMontufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorse / BabcpckMur / ManeroMurphy, ReginaMyler, HarleyNewman DavaNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOlive, JennyOrloff, MichaelOrtega Maiquez, Jose AntonioPaul, ClaytonPellon Jose R.Perez, CesarPetroski, Henry.Planchard David & Marie.Potter / SomertonRastogiRees, HerbertRosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSanchez Vergara / Campos SilvaSchaffer, Saxsena, Antolovich,
Sanders, WarnerSchweitzer, PhilipSemiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Serway/ JewettSeybold, JohnShackelford / AlexanderShankar P NShapiro HowardShaw, MiltonSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSpiegel, Murray R.Sripimanwat, Keattisak (Ed.)Standiford, KevinTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTennant, GeoffTerrella Alcaraz, EnriqueTompkins / WhiteTormos / LovaTurns StephenTurns, StephenWebb F. C.Wunsch , A. DavidYang, KaiYang, WeiZhang / Van Driel / Fan
Editoriales
Academic PressAcribia EditorialAddison Wesley Longman de Mexico
S. A.Alfaomega Grupo Editor S.A. de
C.V.Alpha BooksAmerican Chemical SocietyAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcConacultaCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGowerGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsHarvard Business SchoolIeee Computer SocietyIgi PublishingImperial College PressInternational Thomson EditoresJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearson Benjamin CummingsPearson Educacion de Mexico S.A.
de C.V.Pearson/Addison WesleyPearson/Prentice HallPennwellPlenum Publishing CorporationPrinceton University PressRa-MaRoberts & Company PublishersSintesis, Editorial S. A.Society Of Manufacturing EngineersSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWorld Scientific Publishing Co.
Inc
S. A.Alfaomega Grupo Editor S.A. de
C.V.Alpha BooksAmerican Chemical SocietyAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcConacultaCrc PressCrc Press LlcDover Publications, Inc.E & Fn SponEdiciones UpcElsevier SaundersFondo de Cultura EconomicaGowerGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsHarvard Business SchoolIeee Computer SocietyIgi PublishingImperial College PressInternational Thomson EditoresJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Kluwer Academic PublishersMarcel Dekker, IncMarcomboMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearson Benjamin CummingsPearson Educacion de Mexico S.A.
de C.V.Pearson/Addison WesleyPearson/Prentice HallPennwellPlenum Publishing CorporationPrinceton University PressRa-MaRoberts & Company PublishersSintesis, Editorial S. A.Society Of Manufacturing EngineersSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWorld Scientific Publishing Co.
Inc
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Última actualización: Jul 2019