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Resultados para Tema: Ciencia, Ingenieria (111 a 120 de más de 200)
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Título | Ingenieria de las Reacciones Quimicas | Precio | $349.00 |
| Autor | Evenspiel | Año | 2006 | |
| Editorial | Cesol | Edición | 3ª | |
| Tema | Ingenieria, Quimica, Ciencia | ISBN | 9681858603 |
|
Título | Introduction To Electromagnetic Compatibility (Wiley Series In Microwave And Opt | Precio | $1560.00 |
| Autor | Paul, Clayton | Año | 2006 | |
| Editorial | John Wiley & Sons Inc. | Edición | 2ª | |
| Tema | Ingenieria, Electronica, Ciencia | ISBN | 9780471755005 |
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Título | Theory Of Simple Liquids | Precio | $1210.00 |
| Autor | Hansen / Mcdonald | Año | 2006 | |
| Editorial | Academic Press | Edición | 3ª | |
| Tema | Ciencia, Ingenieria, Teorias | ISBN | 9780123705358 |
|
Título | Variational Principles In Physics | Precio | $780.00 |
| Autor | Basdevant, Jean-Louis | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 1ª | |
| Tema | Ingenieria, Fisica, Ciencia | ISBN | 9780387377476 |
|
Título | Inventive Thinking Through Triz: A Practical Guide | Precio | $1039.35 |
| Autor | Orloff, Michael | Año | 2006 | |
| Editorial | Springer Publishing Company | Edición | 2ª | |
| Tema | Ingenieria, Ciencia, Guias | ISBN | 9783540332220 |
|
Título | Adversarial Reasoning. Computational Approaches To Reading The Opponents Mind | Precio | $1420.00 |
| Autor | Kott Alexander/ Mceneaney William M | Año | 2006 | |
| Editorial | Chapman & Hall / Crc | Edición | 1ª | |
| Tema | Computacion, Ciencia, Ingenieria | ISBN | 9781584885887 |
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Título | Redes Opticas | Precio | $862.00 |
| Autor | Campmany / Ortega | Año | 2006 | |
| Editorial | Universidad Politecnica de Valencia | Edición | 1ª | |
| Tema | Tecnologia, Ciencia, Ingenieria | ISBN | 9788483630013 |
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Título | Engineering Drawing And Design | Precio | $518.00 |
| Autor | Standiford, Kevin | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 4ª | |
| Tema | Ingenieria, Ciencia, Tecnologia | ISBN | 9781418029883 |
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Título | Introduction To Electronics | Precio | $743.00 |
| Autor | Gates | Año | 2006 | |
| Editorial | International Thomson Editores | Edición | 5ª | |
| Tema | Ingenieria, Electronica, Ciencia | ISBN | 9781401889005 |
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Título | Success Through Failure. The Paradox Of Design | Precio | $228.00 |
| Autor | Petroski, Henry. | Año | 2006 | |
| Editorial | Princeton University Press | Edición | 1ª | |
| Tema | Ingenieria, Ciencia, Conocimiento | ISBN | 9780691136424 |
Filtrar resultados
Autores
Aguilar / CortinaAlbiol / GironaAlfonseca Cubero, Enrique( Et.
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezAskeland, D. R.Ayyub Bilal M/ Klir George JBaliga JayantBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBebendorf MarioBechtold / Rudnyi / KorvinkBeichelt FrankBelcher, SamuelBell, W. WBellomo, NicolaBen-Naim, AriehBerk, RonaladBermejo, SergiBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Billo, J.Boccara, NinoBodie / Kane / MarcusBourg, DavidBoylestad, -NashelskyBranki, CherifBrannan James/ Boyce William.Bryant, John; Sangwin, ChrisButz, TilmanCallegaro LucaCampmany / OrtegaCantor, BrianCarter/ GregorichCengel, YunusCengel, Yunus / Boles, MichaelChapman Stephen J.Chapman, StephenChapra Steven C.Chapra, StevenChen, Goong; Zhou, Jianxin (Ed)ChiarellaCho HyungsuckChu Paul/ Liu XuanyongComaniciu / MandayamCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDe Lisi, StevenDel Valle.Devore, JayDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineEnderle / Blanchard / BronzinoEssick JohnEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFinnerty J. D.Fischer-CrippsFisher John P/ Mikos Antonios G/
Bronzino Joseph DFlack, RonaldForouzan, BehrouzForouzan, Behrouz.Fridman Alexander/ Kennedy
Lawrence AGatesGiancoli , Douglas C.Gieck, Kurt; Gieck, ReinerGilmore, RobertGodfrey OnwuboluGoodman, JosephGordon Wilson DavidGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Held GilbertHeng Yeoh Guan/ Tu JiyuanHibbelerHolkundkar AmolInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJoannopoulos/ Johnson/ Winn/
Meade.Jordan, Thomas F.Kahn PeterKaltenbacher, ManfredKantz / SchreiberKaplan, IlyaKatoh ShigeoKehlhofer / WarnerKennedy MichaelKern , Donald Q.KhanKing Paul H/ Fries Richard CKingslake Rudolf/ Johnson Barry RKiusalaas, JaanKnezevic / MilaniKott Alexander/ Mceneaney William
MKreyszig, ErwinKutz, MyerLandau / BinderLandolt DieterLara-Barragan / NuñezLau, Hang T.Law, ChungLee / Speiht / LoyalkaLee David W.Lee, SungguLi, Ming-FuLogan Bruce E.Loney NormanMahalik, Nitaigour (Ed.)Mccabe / Smith / HarriottMesseglia, FlorentMiracle Daniel/ Donaldson Steven.Mitin Vladimir/ Kochelap
Viatcheslav/ Stroscio MichaelMontaigne FenMontgomery Douglas C.Montufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorin DavidMorrison, JohnMorse / BabcpckMuller; Brisebarre; de Dinechin;
Jeannerod; Lefevre; MelquioMur / ManeroMurphy, ReginaNesbitt, BrianNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOhanian , Hans C. ; Market, John
T.Olive, JennyOrloff, MichaelPandey AshokPaul, ClaytonPetroski, Henry.Planchard David & Marie.Planchard David/ Planchard Marie.Potter / SomertonRastogiRivera Figueroa, Antonio.Rosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSalerno, SaverioSanchez Vergara / Campos SilvaSchweitzer, PhilipScott K.Semiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Seybold, JohnShackelford James F.Shan Yin/ Yang AngShankar P NShipley / BeckerSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSripimanwat, Keattisak (Ed.)Standiford, KevinSugumaran VijayanTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTerrella Alcaraz, EnriqueTorge WolfgangToriwaki Junichiro/ Yoshida
HiroyukiTormos / LovaTurns StephenTurns, StephenWalpoleWang Zhenyuan/ Klir GeorgeYang, KaiYang, WeiYe, Zuo GuangYing X, Dong Xu And Jie LiangYoung y FreedmanYounis WasimZhang / Van Driel / Fan
Al.)Ambardar, AshokAnderson J. C. , Leaver K. D,
Leevers P, And Rawlings R. . DArango / SanchezAskeland, D. R.Ayyub Bilal M/ Klir George JBaliga JayantBasdevant, Jean-LouisBasmadjian / FarnoodBatty, MichaelBebendorf MarioBechtold / Rudnyi / KorvinkBeichelt FrankBelcher, SamuelBell, W. WBellomo, NicolaBen-Naim, AriehBerk, RonaladBermejo, SergiBertoline/ Wiebe.Bhadeshia, H. K.d. H. ;
Honeycombe, R. W. K.Billingsley / Bradbeer (Ed.)Billo, J.Boccara, NinoBodie / Kane / MarcusBourg, DavidBoylestad, -NashelskyBranki, CherifBrannan James/ Boyce William.Bryant, John; Sangwin, ChrisButz, TilmanCallegaro LucaCampmany / OrtegaCantor, BrianCarter/ GregorichCengel, YunusCengel, Yunus / Boles, MichaelChapman Stephen J.Chapman, StephenChapra Steven C.Chapra, StevenChen, Goong; Zhou, Jianxin (Ed)ChiarellaCho HyungsuckChu Paul/ Liu XuanyongComaniciu / MandayamCooney, ElaineCordero / MartinezCorral Bustamante LeticiaCramer, Stephen (Ed.)Date, AnilDe Lisi, StevenDel Valle.Devore, JayDoran, PaulineDrabowitch / Papiernik (Et Al)Duffie John/ Beckman WilliamDurand-Charre, MadeleineEnderle / Blanchard / BronzinoEssick JohnEvenspielFermi, EnricoFernandez, EvaFerrando Colom, BartolomeFinnerty J. D.Fischer-CrippsFisher John P/ Mikos Antonios G/
Bronzino Joseph DFlack, RonaldForouzan, BehrouzForouzan, Behrouz.Fridman Alexander/ Kennedy
Lawrence AGatesGiancoli , Douglas C.Gieck, Kurt; Gieck, ReinerGilmore, RobertGodfrey OnwuboluGoodman, JosephGordon Wilson DavidGriebel / Knapek / ZumbuschGuelcher Scott And Hollinger
JeffreyHansen / McdonaldHarris / SollisHarris, HoltonHarris, J.Held GilbertHeng Yeoh Guan/ Tu JiyuanHibbelerHolkundkar AmolInstitution Of Mechanical
EngineersIsermann, RolfIvchenkoJablonski / Turkowski / SzewczykJanssen / Zuidema / WanhillJoannopoulos/ Johnson/ Winn/
Meade.Jordan, Thomas F.Kahn PeterKaltenbacher, ManfredKantz / SchreiberKaplan, IlyaKatoh ShigeoKehlhofer / WarnerKennedy MichaelKern , Donald Q.KhanKing Paul H/ Fries Richard CKingslake Rudolf/ Johnson Barry RKiusalaas, JaanKnezevic / MilaniKott Alexander/ Mceneaney William
MKreyszig, ErwinKutz, MyerLandau / BinderLandolt DieterLara-Barragan / NuñezLau, Hang T.Law, ChungLee / Speiht / LoyalkaLee David W.Lee, SungguLi, Ming-FuLogan Bruce E.Loney NormanMahalik, Nitaigour (Ed.)Mccabe / Smith / HarriottMesseglia, FlorentMiracle Daniel/ Donaldson Steven.Mitin Vladimir/ Kochelap
Viatcheslav/ Stroscio MichaelMontaigne FenMontgomery Douglas C.Montufar Benitez Marco A/ Medina
Marin Joselito.Moore, HollyMorin DavidMorrison, JohnMorse / BabcpckMuller; Brisebarre; de Dinechin;
Jeannerod; Lefevre; MelquioMur / ManeroMurphy, ReginaNesbitt, BrianNieves, Antonio; Domingues,
FedericoNorton / KarczubO'connell / HaileOhanian , Hans C. ; Market, John
T.Olive, JennyOrloff, MichaelPandey AshokPaul, ClaytonPetroski, Henry.Planchard David & Marie.Planchard David/ Planchard Marie.Potter / SomertonRastogiRivera Figueroa, Antonio.Rosato, Dominic And DonaldRoss Sheldon M.Sackinger, EducardSalerno, SaverioSanchez Vergara / Campos SilvaSchweitzer, PhilipScott K.Semiatin S. L.Senft, JamesSerway / JewettSerway, Raymond A. / Moses,
Clement J. / Moyer, Curt A.Seybold, JohnShackelford James F.Shan Yin/ Yang AngShankar P NShipley / BeckerSmith , William F. / Javad HashemiSmith, William FSoberon M. , Francisco X.Sonntang, Richard E. ; Borgnakke,
ClausSripimanwat, Keattisak (Ed.)Standiford, KevinSugumaran VijayanTaniar, DavidTarricone / EspositoTasic / Serdijn / LongTaylor / KleemanTerrella Alcaraz, EnriqueTorge WolfgangToriwaki Junichiro/ Yoshida
HiroyukiTormos / LovaTurns StephenTurns, StephenWalpoleWang Zhenyuan/ Klir GeorgeYang, KaiYang, WeiYe, Zuo GuangYing X, Dong Xu And Jie LiangYoung y FreedmanYounis WasimZhang / Van Driel / Fan
Editoriales
Academic PressAlfaomega Grupo Editor S.A. de
C.V.Alpha BooksAnaya MultimediaAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcCrc / Taylor & FrancisCrc PressDover Publications, Inc.Ediciones UpcElsevier SaundersFondo de Cultura EconomicaGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsIgi PublishingImperial College PressInformation Science PublishingInternational Thomson EditoresIos PressJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Lambert Academic PublishingMarcel Dekker, IncMc Graw Hill EducacionMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearsonPearson Educacion de Mexico S.A.
de C.V.Pearson/Prentice HallPennwellPrincetonPrinceton University PressRa-MaRoberts & Company PublishersSchroff Development CorporationSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWalter Foster PublishingWileyWorld Scientific Publishing Co.
Inc
C.V.Alpha BooksAnaya MultimediaAsm International - The Materials
Information SociAuerbachBirkhauserButterworth-HeinemannCambridge University PressCecsaCesolChandos PublishingChapman & Hall / CrcCrc / Taylor & FrancisCrc PressDover Publications, Inc.Ediciones UpcElsevier SaundersFondo de Cultura EconomicaGrupo Editorial Patria, S.A. de
C.V.Hanser Gardner PublicationsIgi PublishingImperial College PressInformation Science PublishingInternational Thomson EditoresIos PressJohn Wiley & Sons Inc.Johns HopkinsJohns Hopkins University PressJust In Time Press, S.A. de C.V.Lambert Academic PublishingMarcel Dekker, IncMc Graw Hill EducacionMc Graw Hill Interamericana de
MexicoMc Graw-Hill Companies, Inc.Narosa Publushing HouseNelson ThornesOxford University PressPearsonPearson Educacion de Mexico S.A.
de C.V.Pearson/Prentice HallPennwellPrincetonPrinceton University PressRa-MaRoberts & Company PublishersSchroff Development CorporationSpringer Publishing CompanySpringer Science+business Media
Inc.Stylus Publishing, Llc.Taylor & FrancisThe Mit PressThomsonUniversidad Politecnica de
ValenciaUniversity Of Chicago PressVssdWalter Foster PublishingWileyWorld Scientific Publishing Co.
Inc
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